Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11600855
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Filing Dt:
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11/17/2006
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Publication #:
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Pub Dt:
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03/27/2008
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Inventors:
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Naohiro Takahashi, Tamihide Yasumoto
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Title:
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Semiconductor wafer defect inspection method and apparatus
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME |
| NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211-8588, JAPAN |
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| WESTERMAN, HATTORI, DANIELS |
| & ADRIAN, LLP |
| 1250 CONNECTICUT AVENUE, NW SUITE 700 |
| WASHINGTON, DC 20036 |
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