Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11939983
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Filing Dt:
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11/14/2007
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Publication #:
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Pub Dt:
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04/03/2008
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Inventors:
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Paul Frank Marella, Sharon McCauley, Ellis Chang, Carl Hess, William Volk, James Wiley et al
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Title:
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METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| BAKER & MCKENZIE LLP |
| 1114 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036 |
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