Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11655483
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Filing Dt:
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01/19/2007
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Publication #:
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Pub Dt:
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07/24/2008
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Inventors:
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Shaofeng Yu, Richard L. Guldi, Jae Hyun Park, Jiong-Ping Lu, Freidoon Mehrad
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Title:
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Ebeam inspection for detecting gate dielectric punch through and/or incomplete silicidation or metallization events for transistors having metal gate electrodes
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 655474, M/S 3999 |
| DALLAS, TEXAS 75265 |
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| PETER MCLARTY, ESQ. |
| TEXAS INSTRUMENTS INCORPORATED |
| P.O. BOX 655474, M/S 3999 |
| DALLAS, TEXAS 75251 |
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