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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
01/24/2012
Application #:
12014359
Filing Dt:
01/15/2008
Publication #:
Pub Dt:
08/28/2008
Inventor:
Michael Heiden
Title:
APPARATUS AND METHOD FOR MEASURING STRUCTURES ON A MASK AND OR FOR CALCULATING STRUCTURES IN A PHOTORESIST RESULTING FROM THE STRUCTURES
Assignment: 1
Reel/Frame:
020396/0744Recorded: 01/22/2008Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/07/2008
Assignee:
KUBACHER WEG 4
WEILBURG, GERMANY 35781
Correspondent:
MARIA M. ELISEEVA
HOUSTON ELISEEVA LLP
4 MILITIA DRIVE, SUITE 4
LEXINGTON, MA 02421

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