Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/18/2010
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Application #:
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12044241
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Filing Dt:
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03/07/2008
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Publication #:
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Pub Dt:
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09/18/2008
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Inventors:
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Kenichi Washio, Katsuo Yasuta, Umenori Sugiyama
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Title:
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METHOD FOR TESTING A SEMICONDUCTOR WAFER AND APPARATUS THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI |
| TOKYO 180-0004, JAPAN |
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| BRUCE A. JAGGER |
| 6100 CENTER DRIVE |
| SUITE 630 |
| LOS ANGELES, CA 90045 |
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