Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/04/2011
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Application #:
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11857444
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Filing Dt:
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09/19/2007
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Publication #:
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Pub Dt:
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09/18/2008
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Inventors:
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Shigetoshi Sugawa, Akinobu Teramoto
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Title:
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TEST CIRCUIT, WAFER, MEASURING APPARATUS, AND MEASURING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1. KATAHIRA 2-CHOME, AOBA-KU, SENDAI |
MIYAGI, JAPAN |
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JIANQ CHYUN INTELLECTUAL PROPERTY |
7F-1, NO.100, ROOSEVELT RD., SEC.2 |
TAIPEI, 100 TAIWAN |
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