Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/29/2010
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Application #:
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12113781
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Filing Dt:
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05/01/2008
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Publication #:
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Pub Dt:
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11/06/2008
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Inventors:
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Hidetoshi NISHIYAMA, Kei SHIMURA, Sachio UTO, Minori NOGUCHI
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Title:
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PATTERN DEFECT INSPECTION APPARATUS AND METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHISHINBASHI 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| MITCHELL W. SHAPIRO |
| 1751 PINNACLE DRIVE, SUITE 500 |
| MCLEAN, VA 22102-3833 |
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