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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
12153329
Filing Dt:
05/16/2008
Publication #:
Pub Dt:
11/27/2008
Inventors:
Kaoru Sakai, Shunji Maeda
Title:
Pattern inspection method and pattern inspection apparatus
Assignment: 1
Reel/Frame:
021344/0599Recorded: 08/06/2008Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/13/2008
Exec Dt:
06/16/2008
Assignee:
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH SEVENTEENTH STREET
SUITE 1800
ARLINGTON, VA 22209-3873

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