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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11662478
Filing Dt:
02/05/2008
Publication #:
Pub Dt:
12/11/2008
Inventors:
Masami Yakabe, Toshiyuki Matsumoto, Naoki Ikeuchi, Katsuya Okumura
Title:
Microstructure Inspecting Apparatus and Microstructure Inspecting Method
Assignment: 1
Reel/Frame:
020496/0496Recorded: 02/05/2008Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/15/2008
Exec Dt:
01/11/2008
Exec Dt:
01/11/2008
Exec Dt:
01/10/2008
Assignees:
1-22-1-103, WAKABA, SHINJUKU-KU
TOKYO, JAPAN 160-0011
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-8481
Correspondent:
FINNEGAN, HENDERSON, FARABOW, ET AL.
901 NEW YORK AVENUE, NW
WASHINGTON, D.C. 20001-4413

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