Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/27/2011
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Application #:
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12179272
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Filing Dt:
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07/24/2008
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Publication #:
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Pub Dt:
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01/29/2009
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Inventors:
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Hiroshi MIYAI, Yusuke Ominami, Yasuhiro Gunji
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Title:
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ELECTRON BEAM INSPECTION SYSTEM AND AN IMAGE GENERATION METHOD FOR AN ELECTRON BEAM INSPECTION SYSTEM
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-24-14, NISHI SHINBASHI |
MINATO-KU, TOKYO, JAPAN |
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CROWELL & MORING LLP |
P.O. BOX 14300 |
INTELLECTUAL PROPERTY GROUP |
WASHINGTON, DC 20044-4300 |
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