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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	NONE	Issue Dt:		Application #:	11660525	Filing Dt:	03/15/2007
Publication #:	20090039904	Pub Dt:	02/12/2009
Inventors:	Hidenori Kitazume, Wataru Narazaki, Koichi Wada
Title:	Probe card, production method thereof and repairing method of probe card

Assignment: 1

Reel/Frame:

017475/0785

Recorded: 01/12/2006

Pages: 4

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

BARTHAL, HERBERT

Exec Dt:

12/12/2005

BINDER, INGMAR

Exec Dt:

12/15/2005

FUCHS, HEINER

Exec Dt:

12/15/2005

MATTES, RAINER

Exec Dt:

12/15/2005

PFISTER, ALEXANDER

Exec Dt:

12/15/2005

SCHMAUSS, WOLFGANG

Exec Dt:

12/22/2005

SIGWART, EDGAR

Exec Dt:

12/22/2005

Assignee:

SIEMENS AKTIENGESELLSCHAFT

WITTELSBACHERPLATZ 2

MUENCHEN, GERMANY 80333

Correspondent:

ELSA KELLER

SIEMENS CORPORATION

170 WOOD AVENUE SOUTH

INTELLECTUAL PROPERTY DEPARTMENT

ISELIN, NJ 08830

Assignment: 2

Reel/Frame:

019045/0283

Recorded: 03/15/2007

Pages: 4

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

KITAZUME, HIDENORI

Exec Dt:

02/28/2007

NARAZAKI, WATARU

Exec Dt:

02/28/2007

WADA, KOICHI

Exec Dt:

03/05/2007

Assignee:

ADVANTEST CORPORATION

32-1, ASAHICHO 1-CHOME

NERIMA-KU

TOKYO 179-0071, JAPAN

Correspondent:

DAVID G. POSZ

POSZ LAW GROUP, PLC

12040 SOUTH LAKES DRIVE

SUITE 101

RESTON, VA 20191

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