Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/19/2010
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Application #:
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12162912
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Filing Dt:
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07/31/2008
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Publication #:
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Pub Dt:
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02/26/2009
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Inventors:
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Daisuke Ishida, Hiroyuki Nose, Namio Kaneko, Katsuhiro Dobashi, Fumito Sakamoto et al
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Title:
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DEVICE AND METHOD FOR MEASURING PROFILES OF ELECTRON BEAM AND LASER BEAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, TOYOSU 3-CHOME, KOTO-KU |
| TOKYO, JAPAN 135-8710 |
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| 3-1, HONGO 7-CHOME, BUNKYO-KU |
| TOKYO, JAPAN 113-8654 |
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| 9-1, ANAGAWA 4-CHOME, INAGE-KU, CHIBA-SHI |
| CHIBA, JAPAN 263-8555 |
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| GRIFFIN & SZIPL, PC |
| SUITE PH-1 |
| 2300 NINTH STREET, SOUTH |
| ARLINGTON, VA 22204 |
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