Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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02/14/2012
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Application #:
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11887383
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Filing Dt:
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09/28/2007
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Publication #:
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Pub Dt:
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03/26/2009
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Inventors:
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Xiaoqing Wen, Seiji Kajihara
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Title:
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TEST METHOD AND TEST PROGRAM OF SEMICONDUCTOR LOGIC CIRCUIT DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SENSUI-CHO, TOBATA-KU |
| KITAKYUSHU-SHI, FUKUOKA, JAPAN 804-8550 |
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| SEAN M. MCGINN, ESQ. |
| MCGINN INTELLECTUAL PROPERTY LAW GROUP, |
| 8321 OLD COURTHOUSE ROAD, SUITE 200 |
| VIENNA, VA 22182-3817 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 11-13, MINAMI-AOYAMA 2-CHOME |
| MINATO-KU, TOKYO, JAPAN 107-0062 |
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| MCGINN IP LAW GROUP, PLLC |
| 8321 OLD COURTHOUSE ROAD |
| SUITE 200 |
| VIENNA, VA 22182 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10-10-103, HIRAOJOSUI-MACHI, CHUO-KU |
| FUKUOKA-SHI, FUKUOKA, JAPAN 810-0029 |
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| 1-4-5-301, IGISU, IIZUKA-SHI |
| FUKUOKA, JAPAN 820-0053 |
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| MCGINN I.P. LAW GROUP, PLLC |
| 8321 OLD COURTHOUSE ROAD, SUITE 200 |
| VIENNA, VA 22182-3817 |
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