Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11875185
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Filing Dt:
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10/19/2007
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Publication #:
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Pub Dt:
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04/23/2009
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Inventors:
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Richard L. Guldi, Toan Tran, Deepak Ramappa, Steven A. Lytle
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Title:
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TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS IN INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7839 CHURCHILL WAY |
| MS 3999 |
| DALLAS, TEXAS 75251 |
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| DR. PETER MCLARTY, ESQ. |
| 7839 CHURCHILL WAY |
| MS 3999 |
| DALLAS, TX 75251 |
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