Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11946064
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Filing Dt:
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11/28/2007
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Publication #:
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Pub Dt:
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05/28/2009
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Inventors:
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Michal Rosen-Zvi, Justin Wai-chow Wong, Elad Yom-Tov, Yiheng Xu
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Title:
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Method and Computer Program Product for Wafer Manufacturing Process Abnormalities Detection
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| SUZANNE EREZ |
| PO BOX 218 |
| IP LAW DEPARTMENT |
| YORKTOWN HEIGHTS, NY 10598 |
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