Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/27/2012
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Application #:
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12315742
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Filing Dt:
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12/05/2008
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Publication #:
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Pub Dt:
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06/11/2009
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Inventors:
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Naoki Ikeuchi, Hisashi Fujiwara, Masato Hayashi, Masami Yakabe
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Title:
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DISPLACEMENT MEASUREMENT APPARATUS FOR MICROSTRUCTURE AND DISPLCEMENT MEASUREMENT METHOD THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-1, AKASAKA 5-CHOME |
| MINATO-KU, TOKYO, JAPAN 107-6325 |
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| MASUVALLEY & PARTNERS, TATSUO BABA |
| 8765 AERO DRIVE SUITE 312 |
| SAN DIEGO, CALIFORNIA 92123 |
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