Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/30/2010
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Application #:
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12326836
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Filing Dt:
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12/02/2008
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Publication #:
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Pub Dt:
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07/02/2009
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Inventor:
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Sang Yoon YIM
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Title:
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SEMICONDUCTOR CHIP TEST APPARATUS AND TESTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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891-10 DAECHI-DONG, GANGNAM-GU |
SEOUL, KOREA, REPUBLIC OF |
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ERIC L. MASCHOFF |
WORKMAN NYDEGGER |
60 EAST SOUTH TEMPLE, SUITE 1000 |
SALT LAKE CITY, UT 84111 |
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