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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
12393293
Filing Dt:
02/26/2009
Publication #:
20090200462
Pub Dt:
08/13/2009
Inventors:
Sang-il PARK, Yong-Seok KIM, Jitae KIM, Sang Han CHUNG, Hyun-Seung SHIN, Jung-Rok LEE et al
Title:
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTURE
Assignment: 1
Reel/Frame:
022579/0489Recorded: 04/22/2009Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
PARK, SANG-IL
Exec Dt:
04/20/2009
KIM, YONG-SEOK
Exec Dt:
04/20/2009
KIM, JITAE
Exec Dt:
04/21/2009
CHUNG, SANG HAN
Exec Dt:
04/20/2009
SHIN, HYUN-SEUNG
Exec Dt:
04/21/2009
LEE, JUNG-ROK
Exec Dt:
04/20/2009
HWANG, EUICHUL
Exec Dt:
04/20/2009
Assignee:
PARK SYSTEMS CORP.
KANC 4F, LUI-DONG 906-10
SUWON, KOREA, DEMOCRATIC PEOPLE'S REPUBLIC OF 443-766
Correspondent:
PATTERSON & SHERIDAN, L.L.P.
3040 POST OAK BOULEVARD
SUITE 1500
HOUSTON, TX 77056

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