Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/14/2011
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Application #:
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12212289
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Filing Dt:
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09/17/2008
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Publication #:
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Pub Dt:
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08/20/2009
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Inventors:
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Lisa V. Rozario, Andy Strachan, Richard Orr
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Title:
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ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP TRENCH SIDEWALL RELIABILITY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2900 SEMICONDUCTOR DRIVE |
| SANTA CLARA, CALIFORNIA 94111 |
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| STALLMAN & POLLOCK LLP |
| ATTN: MICHAEL J. POLLOCK |
| 353 SACRAMENTO STREET, SUITE 2200 |
| SAN FRANCISCO, CA 94111 |
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