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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
12128420
Filing Dt:
05/28/2008
Publication #:
Pub Dt:
12/03/2009
Inventor:
Eric Wagganer
Title:
Method to create three-dimensional images of semiconductor structures using a focused ion beam device and a scanning electron microscope
Assignment: 1
Reel/Frame:
021013/0294Recorded: 05/29/2008Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/28/2008
Assignee:
4650 CUSHING PARKWAY
FREMONT, CALIFORNIA 94538
Correspondent:
SCHNECK & SCHNECK
P.O. BOX 2-E
SAN JOSE, CA 95109

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