Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
1
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
12200958
|
Filing Dt:
|
08/29/2008
|
Publication #:
|
|
Pub Dt:
|
01/07/2010
| | | | |
Inventors:
|
YIJ CHIEH CHU, CHUN CHI CHEN, YUN-ZONG TIAN, CHENG-HAO CHEN
|
Title:
|
FAULT DETECTION AND CLASSIFICATION METHOD FOR WAFER ACCEPTANCE TEST PARAMETERS
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
NO. 667, FUSING 3RD RD., GUEISHAN TOWNSHIP |
TAOYUAN COUNTY 333, TAIWAN R.O.C. |
|
|
|
MORTON J. ROSENBERG, ESQ. |
ROSENBERG, KLEIN & LEE |
3458 ELLICOTT CENTER DRIVE, SUITE 101 |
ELLICOTT CITY, MARYLAND 21043 |
|
|
Search Results as of:
05/14/2024 09:19 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|