Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/23/2013
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Application #:
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12510794
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Filing Dt:
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07/28/2009
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Publication #:
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Pub Dt:
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02/04/2010
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Inventors:
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Shigeru Wakiyama, Hiroyoshi Yamamoto, Itaru Kitajima, Yoshiteru Shikakura
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Title:
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PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPERATED BY THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8, NAKASE 1-CHOME |
| MIHAMA-KU, CHIBA-SHI, CHIBA, JAPAN 261-8507 |
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| TADASHI HORIE/MASAKO GILL |
| P.O. BOX 10395 |
| CHICAGO, IL 60610 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI-SHIMBASHI 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-0003 |
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| TADASHI HORIE/MASAKO GILL |
| P.O. BOX 10395 |
| CHICAGO, IL 60610 |
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