Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/13/2011
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Application #:
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12376600
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Filing Dt:
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02/06/2009
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Publication #:
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Pub Dt:
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07/15/2010
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Inventors:
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Takashi Masuda, Kouki Yoshida, Takaharu Aoki, Kenichiro Waki
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Title:
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MTF MEASURING SYSTEM, MTF MEASURING METHOD, MTF MEASURING UNIT AND MTF MEASURING PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| MITSUWA OGAWAMACHI BLDG. 3F., 3-7-1, KANDA-OGAWAMACHI, CHIYODA-KU |
| TOKYO, JAPAN 1010052 |
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| RANDOLPH A. SMITH |
| 1901 PENNSYLVANIA AVE., N.W. |
| WASHINGTON, DC 20006-3433 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ROOM 303-305, 3/F., IC DEVELOPMENT CENTER |
| NO. 6 SCIENCE PARK WEST AVENUE, HONG KONG SCIENCE PARK |
| SHATIN, HONG KONG |
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| DANIEL M. GURFINKEL |
| DENNEMEYER & ASSOCIATES, LLC. |
| 2 NORTH RIVERSIDE PLAZA, SUITE 1500 |
| CHICAGO, IL 60606 |
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