Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
06/25/2013
|
Application #:
|
12816834
|
Filing Dt:
|
06/16/2010
|
|
Publication #:
|
|
Pub Dt:
|
01/27/2011
| | | | |
|
Inventors:
|
Kenichi WASHIO, Katsuo Yasuta, Umenori Sugiyama, Hikaru Masuta
|
|
Title:
|
WAFER PROBER FOR SEMICONDUCTOR INSPECTION AND INSPECTION METHOD
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI |
| TOKYO, JAPAN |
|
|
|
|
| BACON & THOMAS, PLLC |
| 625 SLATERS LANE |
| FOURTH FLOOR |
| ALEXANDRIA, VA 22314-1176 |
|
|
Search Results as of:
05/06/2024 02:42 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
