Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
2
|
Patent #:
|
|
Issue Dt:
|
05/27/2014
|
Application #:
|
12873738
|
Filing Dt:
|
09/01/2010
|
Publication #:
|
|
Pub Dt:
|
03/10/2011
| | | | |
Inventors:
|
Yuichi Watanabe, Kiyotaka Shinada, Yuushin Kimura, Shigeru Goto, Yasuhiko Tandou et al
|
Title:
|
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDUCTOR TESTING APPARATUS, AND SEMICONDUCTOR TESTING METHOD
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU |
KAWASAKI-SHI, KANAGAWA, JAPAN 211-8588 |
|
|
2-10-23, SHIN-YOKOHAMA, KOHOKU-KU, |
YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
|
|
|
WESTERMAN, HATTORI, DANIELS & ADRIAN, LL |
1250 CONNECTICUT AVENUE, NW |
SUITE-700 |
WASHINGTON, DC 20036-2657 |
|
|
Assignment:
2
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU |
YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
|
|
|
ARENT FOX LLP |
1717 K STREET, N.W. |
WASHINGTON, DC 20006 |
|
|
Search Results as of:
04/27/2024 05:20 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|