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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
05/27/2014
Application #:
12873738
Filing Dt:
09/01/2010
Publication #:
Pub Dt:
03/10/2011
Inventors:
Yuichi Watanabe, Kiyotaka Shinada, Yuushin Kimura, Shigeru Goto, Yasuhiko Tandou et al
Title:
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDUCTOR TESTING APPARATUS, AND SEMICONDUCTOR TESTING METHOD
Assignment: 1
Reel/Frame:
025021/0449Recorded: 09/21/2010Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/16/2010
Exec Dt:
08/16/2010
Exec Dt:
08/16/2010
Exec Dt:
08/23/2010
Exec Dt:
08/30/2010
Exec Dt:
08/25/2010
Exec Dt:
08/25/2010
Assignees:
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA, JAPAN 211-8588
2-10-23, SHIN-YOKOHAMA, KOHOKU-KU,
YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033
Correspondent:
WESTERMAN, HATTORI, DANIELS & ADRIAN, LL
1250 CONNECTICUT AVENUE, NW
SUITE-700
WASHINGTON, DC 20036-2657
Assignment: 2
Reel/Frame:
035935/0097Recorded: 06/30/2015Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/02/2015
Assignee:
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU
YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033
Correspondent:
ARENT FOX LLP
1717 K STREET, N.W.
WASHINGTON, DC 20006

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