Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12887491
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Filing Dt:
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09/21/2010
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Publication #:
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Pub Dt:
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03/31/2011
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Inventors:
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Wei Wei Ruan, Bin Gong, Wen Shi
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Title:
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STRUCTURE AND METHOD FOR SEMICONDUCTOR TESTING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 18 ZHANG JIANG ROAD, PUDONG NEW AREA |
| SHANGHAI, CHINA 201203 |
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| TOWNSEND AND TOWNSEND AND CREW LLP |
| TWO EMBARCADERO CENTER, EIGHTH FLOOR |
| SAN FRANCISCO, CA 94111-3834 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 18 ZHANG JIANG RD. |
| PUDONG NEW AREA |
| SHANGHAI, CHINA 201203 |
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| 18 WEN CHANG ROAD, ECONOMIC-TECHNOLOGICAL DEVELOPMENT AREA |
| DAXING DISTRICT |
| BEIJING, CHINA 100176 |
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| KILPATRICK TOWNSEND AND STOCKTOWN, LLP |
| TWO EMBARCADERO CENTER |
| EIGHTH FLOOR |
| SAN FRANCISCO, CA 94111-3834 |
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