Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/09/2012
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Application #:
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12703949
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Filing Dt:
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02/11/2010
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Publication #:
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Pub Dt:
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08/11/2011
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Inventors:
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Sung-Nien Kuo, Yuan-Yu Hsieh, Kuei-Chi Juan, Kuan-Cheng Su, Wen-Hsiung Ko, Jih-San Lee
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Title:
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ALTERNATING CURRENT (AC) STRESS TEST CIRCUIT, METHOD FOR EVALUATING AC STRESS INDUCED HOT CARRIER INJECTION (HCI) DEGRADATION, AND TEST STRUCTURE FOR HCI DEGRADATION EVALUATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN |
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| CHUN-MING SHIH |
| 13611 NORTHBOURNE DR. |
| CENTREVILLE, VA 20120 |
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