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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
13061363
Filing Dt:
05/13/2011
Publication #:
Pub Dt:
09/08/2011
Inventors:
Toru Matsumoto, Yoshimitsu Aoki, Masayoshi Tonouchi, Chiko Otani, Hironaru Murakami et al
Title:
SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
Assignment: 1
Reel/Frame:
026274/0919Recorded: 05/13/2011Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/24/2011
Exec Dt:
02/24/2011
Exec Dt:
02/28/2011
Exec Dt:
02/28/2011
Exec Dt:
02/28/2011
Exec Dt:
02/25/2011
Exec Dt:
02/28/2011
Assignees:
1126-1, ICHINO-CHO, HIGASHI-KU,
HAMAMATSU-SHI, SHIZUOKA, JAPAN 435-8558
1-1, YAMADAOKA,
SUITA-SHI, OSAKA, JAPAN 565-0871
2-1, HIROSAWA,
WAKO-SHI, SAITAMA, JAPAN 351-0198
Correspondent:
DRINKER BIDDLE & REATH (DC)
1500 K STREET, N.W.
SUITE 1100
WASHINGTON, DC 20005-1209

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