Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13147899
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Filing Dt:
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08/04/2011
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Publication #:
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Pub Dt:
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12/01/2011
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Inventors:
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Tamao Ishikawa, Yutaka Tandai, Shigeki Kurihara
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Title:
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DEFECT INSPECTION SUPPORT APPARATUS EQUIPPED WITH SEMICONDUCTOR DEFECT INTEGRATED PROJECTION FUNCTION IN WHICH DESIGNED LAYOUT DATA AND DEFECT DATE ARE INTEGRALLY DISPLAYED
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI SHINBASHI 1-CHOME, |
| MINATO-KU, TOKYO, JAPAN |
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| MCDERMOTT WILL & EMERY LLP |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| 17-1, TORANOMON 1-CHOME, MINATO -KU, |
| TOKYO, JAPAN 105-6409 |
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| MCDERMOTT WILL & EMERY LLP |
| 500 NORTH CAPITOL STREET, NW |
| WASHINGTON, DC 20001 |
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