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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/08/2013
Application #:
12823743
Filing Dt:
06/25/2010
Publication #:
Pub Dt:
12/29/2011
Inventors:
Wonmo Kang, M. Taher A. Saif
Title:
APPARATUS AND METHOD FOR IN SITU TESTING OF MICROSCALE AND NANOSCALE SAMPLES
Assignment: 1
Reel/Frame:
024704/0739Recorded: 07/19/2010Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/30/2010
Exec Dt:
07/02/2010
Assignee:
506 SOUTH WRIGHT STREET
352 HENRY ADMINISTRATION BUILDING
URBANA, ILLINOIS 61801
Correspondent:
GREER, BURNS & CRAIN
300 S WACKER DR
25TH FLOOR
CHICAGO, IL 60606
Assignment: 2
Reel/Frame:
025549/0055Recorded: 12/22/2010Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/08/2010
Assignee:
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VIRGINIA 22230
Correspondent:
NATIONAL SCIENCE FOUNDATION
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VA 22230

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