Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/21/2017
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Application #:
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13148473
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Filing Dt:
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08/08/2011
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Publication #:
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Pub Dt:
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12/29/2011
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Inventors:
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Chris Lee, Lisheng Gao, Kenong Wu, Tao Luo, Tommaso Torelli, Brian Duffy et al
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Title:
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Selecting One or More Parameters for Inspection of a Wafer
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| ENTROPY MATTERS LLC |
| P.O. BOX 2250 |
| NEW YORK, NY 10021 |
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