Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/18/2012
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Application #:
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13239830
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Filing Dt:
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09/22/2011
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Publication #:
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Pub Dt:
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01/12/2012
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Inventors:
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Seiji Kamba, Takashi Kondo, Koji Tanaka, Kazuhiro Takigawa, Yuichi Ogawa
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Title:
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METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUCTURE CAUSING DIFFRACTION PHENOMENON, AND MEASURING DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10-1 HIGASHIKOTARI, 1-CHOME, NAGAOKAKYO-SHI |
| KYOTO-FU, JAPAN 617-8555 |
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| DICKSTEIN SHAPIRO |
| 1633 BROADWAY |
| NEW YORK, NY 10019 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE ADD ASSIGNEE PREVIOUSLY RECORDED ON REEL 026947 FRAME 0887. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.
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| 10-1, HIGASHIKOTARI 1-CHOME |
| NAGAOKAKYO-SHI |
| KYOTO-FU, JAPAN 617-8555 |
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| 1-1, KATAHIRA 2-CHOME |
| AOBA-KU, SENDAI-SHI |
| MIYAGI, JAPAN 980-8577 |
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| EDWARD A. MEILMAN |
| DICKSTEIN SHAPIRO LLP |
| 1633 BROADWAY |
| NEW YORK, NY 10019 |
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