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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/19/2013
Application #:
13280199
Filing Dt:
10/24/2011
Publication #:
Pub Dt:
02/16/2012
Inventors:
Shin Ho Chu, Jong Won Lee
Title:
SEMICONDUCTOR INTEGRATED CIRCUIT WITH MULTI TEST
Assignment: 1
Reel/Frame:
029917/0199Recorded: 03/04/2013Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/24/2008
Exec Dt:
06/24/2008
Assignee:
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SI
GYEONGGI-DO
ICHON, KOREA, REPUBLIC OF 467-860
Correspondent:
BAKER & MCKENZIE LLP
2001 ROSS AVENUE
SUITE 2300
DALLAS, TX 75201
Assignment: 2
Reel/Frame:
029943/0378Recorded: 03/07/2013Pages: 26
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/30/2012
Assignee:
2091 GYEONGCHUNGDAE-RO
BUBAL-EUP ICHEON-SI
GYEONGGI-DO, KOREA, REPUBLIC OF
Correspondent:
PATENT DEPARTMENT
BAKER & MCKENZIE LLP
2001 ROSS AVENUE, SUITE 2300
DALLAS, TX 75201

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