Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13266050
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Filing Dt:
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10/24/2011
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Publication #:
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Pub Dt:
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02/23/2012
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Inventors:
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Shuangqi Dong, Takashi Hiroi, Takeyuki Yoshida
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Title:
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DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU |
| TOKYO, JAPAN 105-8717 |
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| MCDERMOTT WILL & EMERY LLP |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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