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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/30/2014
Application #:
13212585
Filing Dt:
08/18/2011
Publication #:
Pub Dt:
03/01/2012
Inventors:
Kohei KATO, Koichi SHIROYAMA, Akinori SHIRAISHI, Shigeru MATSUMURA, Katsushi SUGAI et al
Title:
TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTING APPARATUS
Assignment: 1
Reel/Frame:
027018/0056Recorded: 10/05/2011Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/24/2011
Exec Dt:
08/24/2011
Exec Dt:
08/24/2011
Exec Dt:
08/26/2011
Exec Dt:
08/18/2011
Exec Dt:
08/17/2011
Exec Dt:
08/18/2011
Assignee:
32-1 ASAHICHO, NERIMA-KU
TOKYO, JAPAN 179-0071
Correspondent:
GREENBLUM & BERNSTEIN
1950 ROLAND CLARKE PLACE
RESTON, VA 20191
Assignment: 2
Reel/Frame:
027278/0380Recorded: 11/22/2011Pages: 12
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE OMISSION OF SECOND ASSIGNEE PREVIOUSLY RECORDED ON REEL 027018 FRAME 0056. ASSIGNOR(S) HEREBY CONFIRMS THE TO ADD SECOND ASSIGNEE SHINKO ELECTRIC INDUSTRIES CO.,LTD., 80, OSHIMADA-MACHI, NAGANO-SHI, NAGANO 381-2287, JAPAN.
Assignors:
Exec Dt:
08/24/2011
Exec Dt:
08/24/2011
Exec Dt:
08/24/2011
Exec Dt:
08/26/2011
Exec Dt:
08/18/2011
Exec Dt:
08/17/2011
Exec Dt:
08/18/2011
Assignees:
32-1 ASAHICHO, NERIMA-KU
TOKYO, JAPAN 179-0071
80, OSHIMADA-MACHI, NAGANO-SHI
NAGANO, JAPAN 381-2287
Correspondent:
GREENBLUM & BERNSTEIN
1950 ROLAND CLARKE PLACE
RESTON, VA 20191

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