Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/10/2015
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Application #:
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13235155
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Filing Dt:
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09/16/2011
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Publication #:
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Pub Dt:
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03/22/2012
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Inventors:
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Akira SOMA, Takayuki HAYASHIZAKI, Hideki HIRAKAWA
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Title:
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ELECTRICAL TEST PROBE AND PROBE ASSEMBLY WITH IMPROVED PROBE TIP
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI |
| TOKYO, JAPAN 180-0004 |
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| GRAYBEAL JACKSON LLP |
| 400 - 108TH AVENUE NE |
| SUITE 700 |
| BELLEVUE, WA 98004 |
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