Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/12/2014
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Application #:
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13265935
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Filing Dt:
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12/07/2011
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Publication #:
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Pub Dt:
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04/19/2012
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Inventors:
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Yukihiro Shibata, Toshihiko Nakata, Taketo Ueno, Atsushi Taniguchi, Toshifumi Honda
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Title:
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METHOD OF DEFECT INSPECTION AND DEVICE OF DEFECT INSPECTION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHISHINBASHI 1-CHOME |
| MINATO-KU |
| TOKYO, JAPAN |
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| ANTONELLI, TERRY, STOUT & KRAUS, LLP |
| 1300 NORTH SEVENTEENTH STREET |
| SUITE 1800 |
| ARLINGTON, VA 22209-3873 |
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