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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/16/2013
Application #:
13006639
Filing Dt:
01/14/2011
Publication #:
Pub Dt:
04/26/2012
Inventors:
HUNG-CHIH LIN, Mill-Jer WANG, CHING-NEN PENG, HAO CHEN
Title:
TEST STRUCTURES FOR THROUGH SILICON VIAS (TSVs) OF THREE DIMENSIONAL INTEGRATED CIRCUIT (3DIC)
Assignment: 1
Reel/Frame:
025639/0808Recorded: 01/14/2011Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/10/2011
Exec Dt:
01/10/2011
Exec Dt:
01/10/2011
Exec Dt:
01/10/2011
Assignee:
NO. 8, LI-HSIN RD. VI, HSINCHU SCIENCE PARK
HSINCHU, TAIWAN 300
Correspondent:
LOWE HAUPTMAN HAM & BERNER, LLP (TSMC)
1700 DIAGONAL ROAD, SUITE 300
ALEXANDRIA, VA 22314

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