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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/10/2013
Application #:
13355104
Filing Dt:
01/20/2012
Publication #:
Pub Dt:
05/17/2012
Inventors:
Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Tohru Ishitani, Satoshi Tomimatsu et al
Title:
GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS
Assignment: 1
Reel/Frame:
027570/0288Recorded: 01/20/2012Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/01/2008
Exec Dt:
12/01/2008
Exec Dt:
12/01/2008
Exec Dt:
12/09/2008
Exec Dt:
12/03/2008
Exec Dt:
12/09/2008
Assignee:
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
JUAN CARLOS A. MARQUEZ
1199 NORTH FAIRFAX STREET
SUITE 900
ALEXANDRIA, VA 22314
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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