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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/18/2014
Application #:
13203217
Filing Dt:
08/24/2011
Publication #:
Pub Dt:
06/21/2012
Inventors:
Seung Joo Haam, Yun Mook Lim, Yoon Cheol Lim, JoSeph Park
Title:
Device for Measuring Deformation of a Structure and a Method for Measuring Deformation of a Structure Using the Same
Assignment: 1
Reel/Frame:
026802/0326Recorded: 08/24/2011Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/17/2011
Exec Dt:
08/09/2011
Exec Dt:
08/18/2011
Exec Dt:
08/17/2011
Assignees:
YONSEI UNIVERSITY, 134, SINCHON-DONG
SEODAEMUN-GU
SEOUL, KOREA, REPUBLIC OF 120-743
701 WORLD MERDIAN BIZ CENTER
15-1, YANGPYEONGDONG 3-GA, YEONGDEUNGPO-GU
SEOUL, KOREA, REPUBLIC OF 150-103
Correspondent:
DLA PIPER US LLP
1999 AVENUE OF THE STARS
SUITE 400
LOS ANGELES, CA 90067-6023
Assignment: 2
Reel/Frame:
033277/0289Recorded: 07/03/2014Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/05/2014
Assignees:
YONSEI UNIVERSITY, 134, SINCHON-DONG
SEODAEMUN-GU
SEOUL, KOREA, REPUBLIC OF 120-743
701, WORLD MERDIAN BIZ CENTER, 15-1
YANGPYEONGDONG 3-GA, YEONGDEUNGPO-GU
SEOUL, KOREA, REPUBLIC OF 150-103
Correspondent:
SWANSON & BRATSCHUN, L.L.C.
8210 SOUTHPARK TERRACE
LITTLETON, CO 80120

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