Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/21/2014
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Application #:
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13382415
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Filing Dt:
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01/05/2012
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Publication #:
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Pub Dt:
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07/26/2012
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Inventors:
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Ru Huang, Jibin Zou, Runsheng Wang, Jiewen Fan, Changze Liu, Yangyuan Wang
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Title:
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METHOD FOR TESTING TRAP DENSITY OF GATE DIELECTRIC LAYER IN SEMICONDUCTOR DEVICE HAVING NO SUBSTRATE CONTACT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 5 YIHEYUAN ROAD |
| HAIDIAN DISTRICT |
| BEIJING, CHINA 100871 |
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| HARNESS, DICKEY & PIERCE, PLC |
| P. O. BOX 828 |
| MICHAEL MALINZAK |
| BLOOMFIELD HILLS, MI 48303 |
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