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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/01/2013
Application #:
13444746
Filing Dt:
04/11/2012
Publication #:
Pub Dt:
08/09/2012
Inventors:
Vi Vuong, Junwei Bao, Yan Chen, Weichert Heiko, Sebastien Egret
Title:
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM USING MULTIVARIATE ANALYSIS
Assignment: 1
Reel/Frame:
028030/0442Recorded: 04/11/2012Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/03/2006
Exec Dt:
02/07/2006
Exec Dt:
02/03/2006
Exec Dt:
02/08/2006
Exec Dt:
02/07/2006
Assignee:
2953 BUNKER HILL LANE, SUITE 301
SANTA CLARA, CALIFORNIA 95054
Correspondent:
TOKYO ELECTRON U.S. HOLDINGS, INC.
2545 W. FRYE RD.
SUITE 1
CHANDLER, AZ 85224
Assignment: 2
Reel/Frame:
031876/0756Recorded: 01/02/2014Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/12/2009
Assignee:
AKASAKA BIZ TOWER, 3-1 AKASAKA 5-CHOME
MINATO-KU, TOKYO, JAPAN 107-6325
Correspondent:
TOKYO ELECTRON U.S. HOLDINGS, INC.
2400 GROVE BOULEVARD
AUSTIN, TX 78741

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