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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/08/2016
Application #:
13500305
Filing Dt:
04/05/2012
Publication #:
Pub Dt:
08/09/2012
Inventors:
Kazushi Hayashi, Hiroyuki Takamatsu, Shingo Sumie, Yoshito Fukumoto
Title:
APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
Assignment: 1
Reel/Frame:
027992/0315Recorded: 04/05/2012Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/15/2012
Exec Dt:
03/15/2012
Exec Dt:
03/15/2012
Exec Dt:
03/15/2012
Exec Dt:
03/15/2012
Exec Dt:
03/01/2012
Assignees:
10-26, WAKINOHAMA-CHO 2-CHOME, CHUO-KU, KOBE-SHI
HYOGO, JAPAN 651-8585
5-1, WAKINOHAMAKAIGANDORI 1-CHOME, CHUO-KU, KOBE-SHI
HYOGO, JAPAN 651-0073
Correspondent:
MASAYASU MORI
918 PRINCE STREET
ALEXANDRIA, VA 22314

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