Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13502381
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Filing Dt:
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06/27/2012
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Publication #:
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Pub Dt:
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10/18/2012
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Inventors:
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Torsten Melzer-Jokisch, Andreas Oppert, Dimitrios Thomaidis
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Title:
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METHOD FOR MEASURING LAYER THICKNESS BY MEANS OF LASER TRIANGULATION, AND DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| WITTELSBACHERPLATZ 2 |
| MUENCHEN, GERMANY 80333 |
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| SANDRA BAKER |
| SIEMENS CORPORATION - IP DEPT |
| 170 WOOD AVENUE SOUTH |
| ISELIN, NJ 08830 |
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