Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12020989
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Filing Dt:
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01/28/2008
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Publication #:
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Pub Dt:
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11/01/2012
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Inventors:
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Peter J. Burke, Steffen McKernan, Dawei Wang, Zhen Yu
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Title:
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Device and Method For RF Characterization of Nanostructures and High Impedance Devices
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4311 JAMBOREE ROAD |
| SUITE 150 |
| NEWPORT BEACH, CALIFORNIA 92660 |
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| BRADLEY D. BLANCHE |
| 2450 COLORADO AVENUE |
| SUITE 400E |
| SANTA MONICA, CA 90404 |
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