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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/08/2015
Application #:
13145109
Filing Dt:
01/05/2012
Publication #:
Pub Dt:
11/29/2012
Inventor:
Florian Bieck
Title:
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
028108/0268Recorded: 04/26/2012Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
09/27/2011
Assignee:
13-11 OMORI-KITA 2-CHOME, OTA-KU
TOKYO, JAPAN 143-8580
Correspondent:
ALKIMIE C/O SCHWEIGER& PARTNER (SG) LLP
105 CECIL STREET
#03-02, THE OCTAGON
SINGAPORE, 069534 SINGAPORE
Assignment: 2
Reel/Frame:
027488/0962Recorded: 01/05/2012Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/30/2011
Assignee:
10 UBI CRESCENT #05-37
UBI TECHPARK LOBBY C
SINGAPORE, SINGAPORE 408564
Correspondent:
ALKIMIE C/O SCHWEIGER & PARTNER (SG) LLP
105 CECIL STREET
#03-02 THE OCTAGON
SINGAPORE, 069534 SINGAPORE

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