Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/02/2014
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Application #:
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13486400
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Filing Dt:
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06/01/2012
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Publication #:
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Pub Dt:
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12/06/2012
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Inventors:
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Duk Kyu KWON, Kyu Han LEE, Yong Goo LEE
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Title:
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PROBE CARD FOR TESTING A SEMICONDUCTOR CHIP
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SEOGU-DONG, HWASEONG-SI |
| GYEONGGI-DO, KOREA, REPUBLIC OF 445-170 |
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| HARNESS, DICKEY & PIERCE, P.L.C. |
| 7700 BONHOMME |
| SUITE 400 |
| ST. LOUIS, MO 63105 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 46, SAMSUNG 1-RO 5-GIL, HWASEONG-SI, GYEONGGI-DO |
| HWASEONG-SI, KOREA, REPUBLIC OF |
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| 46, SAMSUNG 1-RO 5-GIL, HWASEONG-SI, GYEONGGI-DO |
| HWASEONG-SI, KOREA, REPUBLIC OF |
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| LEX IP MEISTER, PLLC |
| 5180 PARKSTONE DRIVE, SUITE 175 |
| CHANTILLY, VA 20151 |
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