Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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02/25/2014
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Application #:
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13681182
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Filing Dt:
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11/19/2012
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Publication #:
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Pub Dt:
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03/28/2013
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Inventors:
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Wu-Tung Cheng, Ruifeng Guo, Yu Huang
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Title:
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TEST PATTERN GENERATION FOR DIAGNOSING SCAN CHAIN FAILURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 8005 S.W. BOECKMAN RD. |
| WILSONVILLE, OREGON 97070 |
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| MENTOR GRAPHICS C/O SIEMENS CORPORATION |
| 3501 QUADRANGLE BLVD STE 230 |
| INTELLECTUAL PROPERTY |
| WILSONVILLE, OR 97070 |
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Assignment:
2
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MERGER AND CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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Newly Merged Entity's New Name:
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| 5800 GRANITE PARKWAY, SUITE 600 |
| PLANO, TEXAS 75024 |
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| SIEMENS CORPORATION IP DEPT - MAIL CODE INT-244 |
| 3850 QUADRANGLE BOULEVARD |
| ORLANDO, FL 32817 |
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