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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
13705701
Filing Dt:
12/05/2012
Publication #:
20130097740
Pub Dt:
04/18/2013
Inventors:
James F. Mack, Philip B. Van Stockum, Yonas T. Yemane, Friedrich B. Prinz
Title:
Scanning probe microscopy-based metrology tool with a vacuum partition
Assignment: 1
Reel/Frame:
029584/0368Recorded: 12/10/2012Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
MACK, JAMES F.
Exec Dt:
12/03/2012
VAN STOCKUM, PHILIP B.
Exec Dt:
12/03/2012
YEMANE, YONAS T.
Exec Dt:
12/03/2012
PRINZ, FRIEDRICH B.
Exec Dt:
12/03/2012
Assignee:
BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY, THE
1705 EL CAMINO REAL
PALO ALTO, CALIFORNIA 94306
Correspondent:
LUMEN PATENT FIRM
550 S. CALIFORNIA AVE., SUITE 300
PALO ALTO, CA 94306
Assignment: 2
Reel/Frame:
034746/0786Recorded: 12/30/2014Pages: 2
Conveyance:
CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
Assignor:
BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY, THE
Exec Dt:
04/01/2014
Assignee:
ENERGY, UNITED STATES DEPARTMENT OF
1000 INDEPENDENCE AVE., S.W.
WASHINGTON, DISTRICT OF COLUMBIA 20585
Correspondent:
MICHAEL J. DOBBS
U. S. DEPT. OF ENERGY, IPLD
9800 S. CASS AVE
ARGONNE, IL 60439

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