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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/06/2018
Application #:
13672117
Filing Dt:
11/08/2012
Publication #:
Pub Dt:
05/16/2013
Inventors:
Heng Pan, Matthew Scott Rogers, Aaron Muir Hunter, Stephen Moffatt
Title:
APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION
Assignment: 1
Reel/Frame:
029723/0765Recorded: 01/30/2013Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/03/2012
Exec Dt:
12/07/2012
Exec Dt:
12/04/2012
Exec Dt:
12/09/2012
Assignee:
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondent:
PATTERSON & SHERIDAN, LLP
3040 POST OAK BOULEVARD, SUITE 1500
HOUSTON, TX 77056

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